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Scanning electron microscope
The scanning electron microscope (SEM) is a type of electron microscope that uses a focused beam of high-energy electrons in producing a variety of signals at the surface of a solid specimen. The signals produced by the interacting electrons contain useful information such as the shape, atomic structure and conductivity.
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مجهر إلكتروني ماسح Arabic Сканиращ електронен микроскоп Bulgarian ক্রমবেক্ষক ইলেকট্রন অণুবীক্ষণ যন্ত্র Bengali/Bangla Skenirajući elektronski mikroskop BS Microscopi electrònic de rastreig Catalan مایکڕۆسکۆپی ئەلێکتڕۆنی سکانەر CKB Rastrovací elektronový mikroskop Czech Rasterelektronenmikroskop German Ηλεκτρονικό μικροσκόπιο σάρωσης Greek Scanning electron microscope English
